MSI MS-6496 Bedienungsanleitung

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Seitenansicht 0
No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com
CERTIFICATE
Issued Date: May. 23, 2008
Report No.: 085006R-ITCEP07V04
This is to certify that the following designated product
Product : Personal Computer
Trade name : MSI
Model Number : MS-6496,Wind PC
Company Name
: MICRO-STAR INT’L Co., LTD.
This product, which has been issued the test report listed as above in QuieTek
Laboratory, is based on a single evaluation of one sample and confirmed to
comply with the requirements of the following EMC standard.
EN 55022: 2006 EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006 IEC 61000-4-2 Edition 1.2: 2001-04
EN 61000-3-3:1995+A1: 2001+A2: 2005 IEC 61000-4-3 Edition 3.0: 2006
IEC 61000-4-4: 2004
IEC 61000-4-5 Edition 2.0: 2005
IEC 61000-4-6 Edition 2.2: 2006
IEC 61000-4-8 Edition 1.1: 2001-03
IEC 61000-4-11 Second Edition: 2004-03
TEST LABORATORY
Vincent Lin / Deputy Manager
Seitenansicht 0
1 2 3 4 5 6 ... 164 165

Inhaltsverzeichnis

Seite 1 - CERTIFICATE

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quiete

Seite 2 - Test Report

Report No: 085006R-ITCEP07V04 Page: 7 of 162 1. General Information 1.1. EUT Description Product Name P

Seite 3 - Declaration of Conformity

Report No: 085006R-ITCEP07V04 Page: 97 of 162 6.7. Test Photograph Test Mode : Mode 1: Intel Genuine C

Seite 4 - Statement of Conformity

Report No: 085006R-ITCEP07V04 Page: 98 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 5 - Test Report Certification

Report No: 085006R-ITCEP07V04 Page: 99 of 162 7. Voltage Fluctuation and Flicker 7.1. Test Specificatio

Seite 6 - Laboratory Information

Report No: 085006R-ITCEP07V04 Page: 100 of 162 c) 7 % for equipment which is: - attended whilst in use (f

Seite 7 - TABLE OF CONTENTS

Report No: 085006R-ITCEP07V04 Page: 101 of 162 7.6. Test Result Product Personal Computer Test Item Volta

Seite 8

Report No: 085006R-ITCEP07V04 Page: 102 of 162 Product Personal Computer Test Item Voltage Fluctuation

Seite 9

Report No: 085006R-ITCEP07V04 Page: 103 of 162 Product Personal Computer Test Item Voltage Fluctuation a

Seite 10 - 1.1. EUT Description

Report No: 085006R-ITCEP07V04 Page: 104 of 162 Test Photograph Test Mode : Mode 1: Intel Genuine [email protected]

Seite 11 - 1.2. Mode of Operation

Report No: 085006R-ITCEP07V04 Page: 105 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048*1

Seite 12 - 1.3. Tested System Details

Report No: 085006R-ITCEP07V04 Page: 106 of 162 8. Electrostatic Discharge 8.1. Test Specification Accord

Seite 13

Report No: 085006R-ITCEP07V04 Page: 8 of 162 1.2. Mode of Operation QuieTek has verified the construction

Seite 14 - 1.5. EUT Exercise Software

Report No: 085006R-ITCEP07V04 Page: 107 of 162 8.4. Test Procedure Direct application of discharges to the

Seite 15 - 2.1. Summary of Test Result

Report No: 085006R-ITCEP07V04 Page: 108 of 162 8.6. Test Result Product Personal Computer Test Item Elect

Seite 16 - 2.2. List of Test Equipment

Report No: 085006R-ITCEP07V04 Page: 109 of 162 Product Personal Computer Test Item Electrostatic Dischar

Seite 17

Report No: 085006R-ITCEP07V04 Page: 110 of 162 Product Personal Computer Test Item Electrostatic Dischar

Seite 18

Report No: 085006R-ITCEP07V04 Page: 111 of 162 8.7. Test Photograph Test Mode : Mode 1: Intel Genuine CPU

Seite 19 - 2.3. Measurement Uncertainty

Report No: 085006R-ITCEP07V04 Page: 112 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 20

Report No: 085006R-ITCEP07V04 Page: 113 of 162 9. Radiated Susceptibility 9.1. Test Specification Accordi

Seite 21 - 2.4. Test Environment

Report No: 085006R-ITCEP07V04 Page: 114 of 162 9.4. Test Procedure The EUT and load, which are placed on a

Seite 22 - 3.3. Limit

Report No: 085006R-ITCEP07V04 Page: 115 of 162 9.6. Test Result Product Personal Computer Test Item Radia

Seite 23 - 3.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 116 of 162 Product Personal Computer Test Item Radiated susceptibili

Seite 24 - 3.6. Test Result

Report No: 085006R-ITCEP07V04 Page: 9 of 162 1.3. Tested System Details The types for all equipments, plu

Seite 25

Report No: 085006R-ITCEP07V04 Page: 117 of 162 Product Personal Computer Test Item Radiated susceptibili

Seite 26

Report No: 085006R-ITCEP07V04 Page: 118 of 162 9.7. Test Photograph Test Mode : Mode 1: Intel Genuine CP

Seite 27

Report No: 085006R-ITCEP07V04 Page: 119 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 28

Report No: 085006R-ITCEP07V04 Page: 120 of 162 10. Electrical Fast Transient/Burst 10.1. Test Specificati

Seite 29

Report No: 085006R-ITCEP07V04 Page: 121 of 162 10.4. Test Procedure The EUT is placed on a table that is

Seite 30

Report No: 085006R-ITCEP07V04 Page: 122 of 162 10.6. Test Result Product Personal Computer Test Item Ele

Seite 31

Report No: 085006R-ITCEP07V04 Page: 123 of 162 Product Personal Computer Test Item Electrical fast trans

Seite 32

Report No: 085006R-ITCEP07V04 Page: 124 of 162 Product Personal Computer Test Item Electrical fast trans

Seite 33

Report No: 085006R-ITCEP07V04 Page: 125 of 162 10.7. Test Photograph Test Mode : Mode 1: Intel Genuine

Seite 34

Report No: 085006R-ITCEP07V04 Page: 126 of 162 Test Mode : Mode 2: Intel Genuine [email protected],D-SUB (2048

Seite 35

Report No: 085006R-ITCEP07V04 Page: 10 of 162 1.4. Configuration of Tested System Connection Diagram Si

Seite 36

Report No: 085006R-ITCEP07V04 Page: 127 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 37

Report No: 085006R-ITCEP07V04 Page: 128 of 162 11. Surge 11.1. Test Specification According to Standard

Seite 38

Report No: 085006R-ITCEP07V04 Page: 129 of 162 11.4. Test Procedure The EUT and its load are placed on a

Seite 39

Report No: 085006R-ITCEP07V04 Page: 130 of 162 11.6. Test Result Product Personal Computer Test Item Sur

Seite 40

Report No: 085006R-ITCEP07V04 Page: 131 of 162 Product Personal Computer Test Item Surge Test Mode Mod

Seite 41

Report No: 085006R-ITCEP07V04 Page: 132 of 162 Product Personal Computer Test Item Surge Test Mode Mod

Seite 42 - 3.7. Test Photograph

Report No: 085006R-ITCEP07V04 Page: 133 of 162 11.7. Test Photograph Test Mode : Mode 1: Intel Genuine

Seite 43

Report No: 085006R-ITCEP07V04 Page: 134 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 44

Report No: 085006R-ITCEP07V04 Page: 135 of 162 12. Conducted Susceptibility 12.1. Test Specification Acc

Seite 45 - 4.3. Limit

Report No: 085006R-ITCEP07V04 Page: 136 of 162 12.3. Limit Item Environmental Phenomena Units Te st Spe

Seite 46 - 4.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 11 of 162 1.5. EUT Exercise Software 1 Setup the EUT and simulators

Seite 47 - 4.6. Test Result

Report No: 085006R-ITCEP07V04 Page: 137 of 162 12.6. Test Result Product Personal Computer Test Item Con

Seite 48

Report No: 085006R-ITCEP07V04 Page: 138 of 162 Product Personal Computer Test Item Conducted susceptibil

Seite 49

Report No: 085006R-ITCEP07V04 Page: 139 of 162 Product Personal Computer Test Item Conducted susceptibil

Seite 50

Report No: 085006R-ITCEP07V04 Page: 140 of 162 12.7. Test Photograph Test Mode : Mode 1: Intel Genuine

Seite 51

Report No: 085006R-ITCEP07V04 Page: 141 of 162 Test Mode : Mode 2: Intel Genuine [email protected],D-SUB (2048

Seite 52

Report No: 085006R-ITCEP07V04 Page: 142 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 53

Report No: 085006R-ITCEP07V04 Page: 143 of 162 13. Power Frequency Magnetic Field 13.1. Test Specificatio

Seite 54

Report No: 085006R-ITCEP07V04 Page: 144 of 162 13.6. Test Result Product Personal Computer Test Item Pow

Seite 55

Report No: 085006R-ITCEP07V04 Page: 145 of 162 Product Personal Computer Test Item Power frequency magne

Seite 56

Report No: 085006R-ITCEP07V04 Page: 146 of 162 Product Personal Computer Test Item Power frequency magne

Seite 57

Report No: 085006R-ITCEP07V04 Page: 12 of 162 2. Technical Test 2.1. Summary of Test Result No deviat

Seite 58

Report No: 085006R-ITCEP07V04 Page: 147 of 162 13.7. Test Photograph Test Mode : Mode 1: Intel Genuine

Seite 59

Report No: 085006R-ITCEP07V04 Page: 148 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 60

Report No: 085006R-ITCEP07V04 Page: 149 of 162 14. Voltage Dips and Interruption 14.1. Test Specification

Seite 61

Report No: 085006R-ITCEP07V04 Page: 150 of 162 14.4. Test Procedure The EUT and its load are placed on a

Seite 62

Report No: 085006R-ITCEP07V04 Page: 151 of 162 14.6. Test Result Product Personal Computer Test Item Vol

Seite 63

Report No: 085006R-ITCEP07V04 Page: 152 of 162 Product Personal Computer Test Item Voltage dips and inte

Seite 64

Report No: 085006R-ITCEP07V04 Page: 153 of 162 Product Personal Computer Test Item Voltage dips and inte

Seite 65

Report No: 085006R-ITCEP07V04 Page: 154 of 162 14.7. Test Photograph Test Mode : Mode 1: Intel Genuine

Seite 66

Report No: 085006R-ITCEP07V04 Page: 155 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (204

Seite 67

Report No: 085006R-ITCEP07V04 Page: 156 of 162 15. Attachment  EUT Photograph (1) EUT Photo (2) EUT Phot

Seite 68

Report No: 085006R-ITCEP07V04 Page: 13 of 162 2.2. List of Test Equipment Conducted Emission / SR1 Instr

Seite 69

Report No: 085006R-ITCEP07V04 Page: 157 of 162 (3) EUT Photo (4) EUT Photo

Seite 70

Report No: 085006R-ITCEP07V04 Page: 158 of 162 (5) EUT Photo (6) EUT Photo

Seite 71

Report No: 085006R-ITCEP07V04 Page: 159 of 162 (7) EUT Photo (8) EUT Photo

Seite 72

Report No: 085006R-ITCEP07V04 Page: 160 of 162 (9) EUT Photo (10) EUT Photo

Seite 73

Report No: 085006R-ITCEP07V04 Page: 161 of 162 (11) EUT Photo (12) EUT Photo

Seite 74 - 4.7. Test Photograph

Report No: 085006R-ITCEP07V04 Page: 162 of 162 (13) EUT Photo

Seite 75

Report No: 085006R-ITCEP07V04 Page: 14 of 162 Radiated susceptibility / CB5 Instrument Manufacturer Ty

Seite 76

Report No: 085006R-ITCEP07V04 Page: 15 of 162 CDN T400 Schaffner TRA U150 21166 2008/04/21 Coupling De

Seite 77

Report No: 085006R-ITCEP07V04 Page: 16 of 162 2.3. Measurement Uncertainty Conducted Emission The measure

Seite 78

Test Report Product Name:Personal Computer Model No. :MS-6496,Wind PC Applicant : MICRO-STAR INT’L Co., LTD. Address : No. 69, Li-De

Seite 79

Report No: 085006R-ITCEP07V04 Page: 17 of 162 Conducted susceptibility As what is concluded in the docume

Seite 80 - 5.3. Limit

Report No: 085006R-ITCEP07V04 Page: 18 of 162 2.4. Test Environment Performed Item Items Required Ac

Seite 81 - 5.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 19 of 162 3. Conducted Emission (Main Terminals) 3.1. Test Specifica

Seite 82

Report No: 085006R-ITCEP07V04 Page: 20 of 162 3.4. Test Procedure The EUT and simulators are connected to

Seite 83

Report No: 085006R-ITCEP07V04 Page: 21 of 162 3.6. Test Result Site : SR-1 Time : 2008/04/29 - 02:21 Limi

Seite 84

Report No: 085006R-ITCEP07V04 Page: 22 of 162 Site : SR-1 Time : 2008/04/29 - 02:22 Limit : CISPR_B_00M_

Seite 85

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Seite 86

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Seite 87

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Seite 88 - 5.7. Test Photograph

Report No: 085006R-ITCEP07V04 Page: 26 of 162 Site : SR-1 Time : 2008/04/29 - 02:24 Limit : CISPR_B_00M_

Seite 89

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Appr

Seite 90

Report No: 085006R-ITCEP07V04 Page: 27 of 162 Site : SR-1 Time : 2008/04/29 - 01:09 Limit : CISPR_B_00M_

Seite 91 - 6.3. Limit

Report No: 085006R-ITCEP07V04 Page: 28 of 162 Site : SR-1 Time : 2008/04/29 - 01:11 Limit : CISPR_B_00M_

Seite 92

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Seite 93 - 6.4. Test Procedure

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Seite 94 - 6.6. Test Result

Report No: 085006R-ITCEP07V04 Page: 31 of 162 Site : SR-1 Time : 2008/04/29 - 01:12 Limit : CISPR_B_00M_

Seite 95

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Seite 96 - Test Item Power Harmonics

Report No: 085006R-ITCEP07V04 Page: 33 of 162 Site : SR-1 Time : 2008/05/19 - 14:05 Limit : CISPR_B_00M_

Seite 97

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Seite 98

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Seite 99

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Seite 100 - 6.7. Test Photograph

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601

Seite 101 - Report No: 085006R-ITCEP07V04

Report No: 085006R-ITCEP07V04 Page: 37 of 162 Site : SR-1 Time : 2008/05/19 - 14:09 Limit : CISPR_B_00M_

Seite 102 - 7.3. Limit

Report No: 085006R-ITCEP07V04 Page: 38 of 162 Site : SR-1 Time : 2008/05/19 - 14:09 Limit : CISPR_B_00M_

Seite 103 - 7.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 39 of 162 3.7. Test Photograph Test Mode : Mode 1: Intel Genuine CP

Seite 104 - 7.6. Test Result

Report No: 085006R-ITCEP07V04 Page: 40 of 162 Test Mode : Mode 2: Intel Genuine [email protected],D-SUB (2048*

Seite 105 - Test Mode

Report No: 085006R-ITCEP07V04 Page: 41 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2

Seite 106

Report No: 085006R-ITCEP07V04 Page: 42 of 162 4. Conducted Emissions (Telecommunication Ports) 4.1. Test

Seite 107 - Test Photograph

Report No: 085006R-ITCEP07V04 Page: 43 of 162 4.4. Test Procedure Telecommunication Port: The mains volta

Seite 108

Report No: 085006R-ITCEP07V04 Page: 44 of 162 4.6. Test Result Site : SR-1 Time : 2008/04/29 - 02:13 Limi

Seite 109 - 8.3. Limit

Report No: 085006R-ITCEP07V04 Page: 45 of 162 Site : SR-1 Time : 2008/04/29 - 02:14 Limit : ISN_Voltage_

Seite 110 - 8.4. Test Procedure

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Seite 111

Report No: 085006R-ITCEP07V04 Page: 2 of 162 Test Report Certification Issued Date : 2008/0

Seite 112

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Seite 113

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Seite 114 - 8.7. Test Photograph

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Seite 115

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Seite 116 - 9.3. Limit

Report No: 085006R-ITCEP07V04 Page: 51 of 162 Site : SR-1 Time : 2008/04/29 - 02:05 Limit : ISN_Voltage_

Seite 117 - 9.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 52 of 162 Site : SR-1 Time : 2008/04/29 - 02:05 Limit : ISN_Voltage_

Seite 118

Report No: 085006R-ITCEP07V04 Page: 53 of 162 Site : SR-1 Time : 2008/04/29 - 01:28 Limit : ISN_Voltage_

Seite 119

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Seite 120

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Seite 121 - 9.7. Test Photograph

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Seite 122

Report No: 085006R-ITCEP07V04 Page: 3 of 162 Laboratory Information We , QuieTek Corporation, are an indep

Seite 123 - 10.3. Limit

Report No: 085006R-ITCEP07V04 Page: 57 of 162 Site : SR-1 Time : 2008/04/29 - 01:37 Limit : ISN_Voltage_

Seite 124 - 10.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 58 of 162 Site : SR-1 Time : 2008/04/29 - 01:37 Limit : ISN_Voltage_

Seite 125

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Seite 126

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Seite 127

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Seite 128 - 10.7. Test Photograph

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Seite 129

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Seite 130

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Seite 131

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Seite 132 - 11.4. Test Procedure

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Seite 133

Report No: 085006R-ITCEP07V04 Page: 4 of 162 TABLE OF CONTENTS Description

Seite 134

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Seite 135

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Seite 136 - 11.7. Test Photograph

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Seite 137

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Seite 138 - 12.2. Test Setup

Report No: 085006R-ITCEP07V04 Page: 71 of 162 4.7. Test Photograph Test Mode : Mode 1: Intel Genuine CP

Seite 139 - 12.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 72 of 162 Test Mode : Mode 1: Intel Genuine [email protected],D-SUB (2048

Seite 140

Report No: 085006R-ITCEP07V04 Page: 73 of 162 Test Mode : Mode 2: Intel Genuine [email protected],D-SUB (2048*

Seite 141

Report No: 085006R-ITCEP07V04 Page: 74 of 162 Test Mode : Mode 2: Intel Genuine [email protected],D-SUB (2048

Seite 142

Report No: 085006R-ITCEP07V04 Page: 75 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 143 - 12.7. Test Photograph

Report No: 085006R-ITCEP07V04 Page: 76 of 162 Test Mode : Mode 2: Intel Genuine [email protected],D-SUB (2048

Seite 144

Report No: 085006R-ITCEP07V04 Page: 5 of 162 6.1. Test Specification ...

Seite 145

Report No: 085006R-ITCEP07V04 Page: 77 of 162 5. Radiated Emission 5.1. Test Specification According to

Seite 146

Report No: 085006R-ITCEP07V04 Page: 78 of 162 5.4. Test Procedure The EUT and its simulators are placed o

Seite 147

Report No: 085006R-ITCEP07V04 Page: 79 of 162 5.6. Test Result Site : SITE-1 Time : 2008/04/25 - 14:15 Li

Seite 148

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Seite 149

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Seite 150 - 13.7. Test Photograph

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Seite 151

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Seite 152 - 14.3. Limit

Report No: 085006R-ITCEP07V04 Page: 84 of 162 Site : SITE-1 Time : 2008/04/25 - 14:59 Limit : CISPR_B_10

Seite 153 - 14.4. Test Procedure

Report No: 085006R-ITCEP07V04 Page: 85 of 162 5.7. Test Photograph Test Mode : Mode 1: Intel Genuine CP

Seite 154

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Seite 155

Report No: 085006R-ITCEP07V04 Page: 6 of 162 11. Surge...

Seite 156

Report No: 085006R-ITCEP07V04 Page: 87 of 162 Test Mode : Mode 3: Intel Genuine [email protected],D-SUB (2048

Seite 157 - 14.7. Test Photograph

Report No: 085006R-ITCEP07V04 Page: 88 of 162 6. Harmonic Current Emission 6.1. Test Specification Acco

Seite 158

Report No: 085006R-ITCEP07V04 Page: 89 of 162 (b) Limits of Class B Harmonics Currents For Class B equip

Seite 159 -  EUT Photograph

Report No: 085006R-ITCEP07V04 Page: 90 of 162 6.4. Test Procedure The EUT is supplied in series with powe

Seite 160 - (4) EUT Photo

Report No: 085006R-ITCEP07V04 Page: 91 of 162 6.6. Test Result Product Personal Computer Test Item Power

Seite 161 - (6) EUT Photo

Report No: 085006R-ITCEP07V04 Page: 92 of 162 Test Result: Pass Source qualification

Seite 162 - (8) EUT Photo

Report No: 085006R-ITCEP07V04 Page: 93 of 162 Product Personal Computer Test Item Power Harmonics Test

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Report No: 085006R-ITCEP07V04 Page: 94 of 162 Test Result: Pass Source qualificati

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Report No: 085006R-ITCEP07V04 Page: 95 of 162 Product Personal Computer Test Item Power Harmonics Test

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Report No: 085006R-ITCEP07V04 Page: 96 of 162 Test Result: Pass Source qualificati

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